Nec Electronics America thought of helping out the engineers and launched a new operational amplifier (op amp) suitable for integrated-circuit test applications. More precisely, the device will be integrated in the tests regarding the higher capacitive loads per channel and the differences existing between a wide variety of ICs (integrated circuits) with dissimilar capacitances.
According to the manufacturer, by using Necs latest product, the engineers will benefit from more precise measurements, as the uPC835 junction field-effect transistor (JFET)-type op amp comes in high slew rates, a maximum capable capacitive load that measures four times higher than the nearest competitor product and a 3 x 3 millimeter (mm) thin-scaled small-outline package (TSSOP) for increased design flexibility.
"We recognized the need for designers to have an op amp designed specifically to meet the unique needs of semiconductor test equipment and responded with the uPC835," said Bart Ladd, general manager, standard solutions strategic business unit, NEC Electronics America. "This product provides the high slew rates, high capacitive loads and small size necessary to power the test equipment used to verify next-generation semiconductors."
Because of its capabilities, Necs uPC835 is considered to be suitable for IC, memory, system-on-chip (SOC) and logic test equipment. A capacitive load of 4000 picofarads (pF), four times higher than the current offering, enables engineers to test higher capacitive loads per channel and a wider variety of ICs with different capacitances. The uPC835 JFET op amp also features a low input offset of +/- 3 millivolts (mV) (maximum).
The engineering samples of Necs uPC835 JFET op amp are available now and are priced at $1.20 in sample quantities. Volume production is scheduled to
begin in October.
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